Teseq’s NSG 3060 is an easy-to-use
multifunction generator that simulates electromagnetic interference
effects for immunity testing in conformity with international, national
and manufacturers’ standards including the latest IEC/EN standards. The
NSG 3060 system is designed to fulfill conducted EMC test requirements
for CE mark testing and ANSI C62.41, including Combination Wave Surge
(6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave
(6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable
the system to be configured for a much broader range of applications
including Telecom Surge 10/700 and Magnetic Field tests.
Featuring
an innovative modular design, the NSG 3060 is a versatile system that
can be configured for basic testing needs and expanded to meet the needs
of sophisticated test laboratories. Teseq’s well proven “Master-Slave”
architecture enables individual pulse modules to be calibrated
separately, with calibration data and correction factors stored on the
slave controller. New modules can be easily installed with no need to
return the entire system for calibration.
Depending on your exact
testing needs, different models are available to ensure the NSG 3060 is
configured to your exact testing requirements.
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5 and ANSI (IEEE) 62.41
| Parameter | Value |
|---|---|
|
Pulse voltage (open circuit) |
±200 V to 6.6 kV (in 1 V steps) |
|
Pulse current (short circuit) |
±100 A to 3.3 kA |
|
Impedance |
2/12 Ω |
|
Polarity |
positive / negative / alternate |
|
Pulse repetition |
10* s, up to 600 s (in 1 s steps) |
|
Test duration |
1 to 9999 pulses, continuous |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
|
Coupling |
ANSI / IEC / external |
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
| Parameter | Value |
|---|---|
|
Pulse amplitude |
±200 V to 4.8 kV (in 1 V steps) - open circuit |
|
Burst frequency |
100 Hz to 1000 kHz |
|
Polarity |
positive / negative / alternate |
|
Repetition time |
1 ms to 4200 s (70 min) |
|
Burst time |
1 μs to 1999 s, single pulse, continuous |
|
Test duration |
1 s to 1000 h |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
|
Coupling |
ANSI / IEC / external |
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
| Parameter | Value |
|---|---|
|
Dips, Interrupts & Variations |
From EUT voltage input to 0 V, 0% |
|
Uvar with optional variac |
depending on model (VAR 3005) |
|
Uvar with step transformer |
0, 40, 70, 80% (INA 650x) |
|
Peak inrush current capability |
500 A (at 230 V) |
|
Switching times |
1 to 5 μs (100 Ω load) |
|
Event time |
20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles |
|
Test duration |
1 s to 70’000 min, 1 to 99’999 events, continuous |
|
Repetition time |
40 μs to 35 min, 1 to 99’999 cycles |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
Ringwave 0.5 μs/100 kHz
Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41
| Parameter | Value |
|---|---|
|
Pulse voltage (open circuit) |
± 200 V to 6.6 kV (in 1 V steps) |
|
Pulse current (short circuit) |
±16.6 to ±550 A, ±10% |
|
Impedance |
12/30/200 Ω |
|
Polarity |
positive / negative / alternate |
|
Pulse repetition |
10* s, up to 600 s (in 1 s steps) |
|
Test duration |
1 to 9999 pulses, continuous |
|
Phase synchronization |
asynchronous, synchronous 0 to 359º (in 1º steps) |
|
Coupling |
ANSI / IEC / external |
